Equipment

Enviromental Thermal Chamber • CFC-Free Refrigerants • 5 C/min to 30 C/min Change Rates • Cable Notch • Electrical Disconnect Switch • Refrigeration Gauges • Thermo-trimmer • 6850 Programmer Controller • Product Temperature Control Software • IEEE-488 or RS-232/485 Interface • System Monitor • Therm-Alarm • Chart recorder
Unholtz-Dicki Shaker • 600 to 1,000 lbs (2.7 to 4.5kn) Force • 300 "g" Shock, 100 "g" Steady State Sine and Random Vibration • Completely Air Cooled • 2 inch (51 mm) Displacement (Intermittent) • Pedestal Base • 7 inch (178 mm) Diameter Armature, 6 inch (152mm) Outer Bolt Hole Circle • Linear and Switching Power Amplifier Configurations • Easy Installation • Combined Environment Support
MTS Nano Indenter XP with Continuous Stiffness Measurement The Nano Indenter® XP is an indentation system without equal. The Nano Indenter® XP's robust construction and design as well as its ease of use make it ideal for the quality control environment, but its sensitivity and flexibility make it ideal for your R&D lab as well. The Nano Indenter® XP is the first instrument in the world to truly bring ultra-low load indentation and microhardness testing into the same system. Measurement of hardness and modulus from a depth-sensing indentation requires measurement of the stiffness of the contact between the indenter and the materials being tested. Using conventional techniques that Nano Instruments made available at it inception, the only measure of stiffness comes from the unloading portion of the experiment. With the CSM technique employed, the stiffness measured continuously during the indentation, i.e., at every point that a load-displacement data pair is taken, the stiffness is directly measured. There is no other way to make this measurement.
MTS 858 Tabletop system The MTS 858 Tabletop Test System offer a high quality dynamic workstation in a small footprint package from 5KN to 25 KN load range. The system can be configured with a variety of force ratings and controllers. Axial-torsional testing capability is also available. Applications of the sytem includes: - Low-force testing of biomaterials and biomechanical constructs. - Fatigue life and durability test on components. - Pre-cracking fracture mechanics specimens. - Characterizing the static and fatigue properties of low-strength matals. - Monotonic tests such as tension, compression, and bending, as well as creep and fatigue. - QC evaluation and low-frequency testing of elastomeric materials and components.
Nano-resolution phase shifting Moire interferometer - Nano-resolution phase shifting Moire interferometer provides full-field real time plane strain with nano-scale resolution. - As a holographic method, the phase shifting enhanced Moire interferometer is an advanced tool to perform tests and material property characterization on the next generation electronic packaging. Advantages and applications of the system include: - Nano-scale resolution for testing next generation electronic packaging. - Real time visualization of strain distribution. - High resolution and variable magnification. - Unique software provides automatic fringe analysis. - Tests under different loading environments or their combinations (i.e. thermal, electric, etc) - Full field strain measurement (compared with single point strain gage) - Provide both temperal and spatial characterization. - Enable customized experiments and tests.

For further information, please contact Dr. Cemal Basaran (cjb@buffalo.edu).

102 Ketter Hall • Buffalo, New York 14260 • Phone: 716-645-4375 • Fax: 716-645-3733